HomeFacilitiesInstrumentsUser InstrumentsSurface Analysis and CharacterizationX-ray photoelectron spectroscopy XPS

X-ray photoelectron spectroscopy XPS

Clark D10

X-ray photoelectron spectroscopy (XPS), also known as electron spectroscopy for chemical analysis (ESCA), is a surface analysis technique which enables compositional and chemical analysis of materials. Sensitive to 0.1 atomic%, standard analysis includes quantitative elemental analysis as well as chemical bonding information and is possible on a variety of samples (films, polymers, ceramics, powders, etc.). Our XPS systems are capable of a variety of additional techniques including:

  • Ion sputtering for depth profiling or contaminant removal;
  • He ultraviolet source for UPS analysis (valence band information and work functions possible);
  • In situ sample tilting for near-surface depth analysis;
  • Air-free sample transfer pucks for loading directly from glove box;
  • Elemental or chemical imaging;

Our primary XPS tool is a Thermo Scientific Nexsa G2 surface analysis system.

Users can submit samples for XPS measurement by our staff, or be trained to operate the system independently.


XPS sample submission:
Samples can be submitted in Clark D21. Include a sample submission form with your sample.
Provide as much information as possible about the information you want from the measurement. If you want a more complex measurement (depth profiling, area mapping, UPS, etc.), contact the tool manager before submitting samples.

Nexsa Documents:

Miscellaneous links and documents:

For rates information, please see the rates page.
Primary Contact

Alicia Tripp
(607) 255-3608
amt342@cornell.edu
Clark Hall, Room D-21

Secondary Contact

Jonathan Shu
607/255-9833
jbs24@cornell.edu
Clark Hall, Room 633
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