X-ray photoelectron spectroscopy (XPS), also known as electron spectroscopy for chemical analysis (ESCA), is a surface analysis technique which enables compositional and chemical analysis of materials. Sensitive to 0.1 atomic%, standard analysis includes quantitative elemental analysis as well as chemical bonding information and is possible on a variety of samples (films, polymers, ceramics, powders, etc.). Our XPS systems are capable of a variety of additional techniques including:
Our primary XPS tool is a Thermo Scientific Nexsa G2 surface analysis system.
Users can submit samples for XPS measurement by our staff, or be trained to operate the system independently.