HomeFacilitiesInstrumentsUser InstrumentsElectron and Optical MicroscopyNION UltraSTEM 100

NION UltraSTEM 100

20081022150538_STEMsuper.jpg-thumb_0Duffield Hall 150

The SuperSTEM has a spherical aberration corrector integrated into its column, which nulls all axial aberrations up to fifth order. As a result, an angstrom-scale probe with 0.1 nA of current enables imaging with angstrom-level (0.1 nm) resolution. The electron optics can be quickly changed to produce a 2-3 angstrom probe with 1 nA or more of current for analytical purposes (electron energy loss spectroscopy). Samples can be automatically oriented to a given axis.

For rates information, please see the rates page.

Primary Contact

Malcolm (Mick) Thomas
Duffield Hall, Room 150
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